Analyzing and Interpreting Continuous Data Using JMP:: A by Jose G. Ramirez Ph.D., Brenda S. Ramirez M.S.

By Jose G. Ramirez Ph.D., Brenda S. Ramirez M.S.

I spent it slow to learn this masterpiece and sensible statistical book-Analyzing and interpretting non-stop info utilizing JMP,Frankly i must say i used to be deeply attracted by means of the sensible wisdom and instance supplied, i need to say this can be the best statistical e-book that I ever learn. this can be a reliable commence for each strategy engineer so that you can enforce technique strong and able development actions, I hugely instructed this booklet for anyone who's to profit useful statistic in addition to tips on how to function JMP software program successfully.

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Additional resources for Analyzing and Interpreting Continuous Data Using JMP:: A Step-by-Step Guide

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Chapter 1: Using This Book 19 JMP Figure Annotations Each chapter has numerous figures that capture the JMP instructions for the analyses together with the corresponding output. At times, these figures are annotated with additional information for ease of use or interpretation. Most of the time these annotations are presented to the left- and right-hand side of the output. 12 below shows an example of an annotation outside of the output. 12 Example of Annotation Outside of JMP Output There are a few instances, however, where the annotations are included within the JMP input window or the JMP output window.

Among these characteristics we have bond strength, thickness, delamination resistance, and the lack of certain types of defects. We need to think ahead and decide which characteristics are directly related to the objectives of our study, so we can achieve results that are valid, useful, and lead to actions. When measuring a given attribute or quality characteristic, there are four types of measurement scales that can be used to classify the data at hand: nominal, ordinal, interval, and ratio scales.

To further illustrate the difference between an experimental and observation unit, let us consider a study involving the deposition of an oxide layer on wafers, which requires a sample size of 20 experimental units. 6 shows the five thickness measurements taken on one wafer in the upper left (UL), upper right (UR), Center (C), lower left (LL), and lower right (LR) side of the wafer. Do these five measurements count toward our required sample size of 20 experimental units? 6 Thickness Measurements Taken on One Wafer Well, perhaps.

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